Title: Setting statistical specifications for critical to quality characteristics

Authors: Philip G. Rowe

Addresses: Six Sigma Group, Bourton Hall, Rugby, Warwickshire, CV23 9SD, UK

Abstract: This paper presents, by way of a case study, a methodology compatible with Design For Six Sigma (DFSS) for constructing comprehensive statistical design and process control specifications for Critical-to-Quality (CTQ) characteristics, which require tolerances. The method can be used for stand-alone CTQs, but is most effective when employed with a system transfer function Y = f(X), since this enables the transmission of variation through the system to be quantified, amongst other things. Also discussed is the significance of human aspects associated with, what seems at first sight, complicated statistically based design specifications.

Keywords: six sigma; statistical process control; SPC; reject control limits; design for six sigma; DFSS; critical-to-quality; variation; parameter design; tolerance design.

DOI: 10.1504/IJSSCA.2006.009371

International Journal of Six Sigma and Competitive Advantage, 2006 Vol.2 No.1, pp.89 - 103

Published online: 23 Mar 2006 *

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