Int. J. of Information Technology and Management   »   2013 Vol.12, No.1/2



Title: An RFID-based manufacture process control and supply chain management in the semiconductor industry


Authors: Yung-Shun Tsai; Ruey-Shun Chen; Yeh-Cheng Chen; Chun-Ping Yeh


Institute of Information Management, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, Taiwan
Department of Information Management, China University of Technology, 530 Sec. 3 Chung Shan Road, Hukou, Hsinchu, Taiwan
Department of Computer Science and Information Engineering, National Cheng-Kung University, No. 1, University Road, Tainan City 701, Taiwan
Institute of Information Management, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, Taiwan


Abstract: This study proposed an RFID management information system that integrated three common areas in semiconductor testing industry including inventory flows management, location control in warehouse, and handcar localisation. The main core of this research focused on cassette management in semiconductor test industry. The entire management flow enters the warehouse management from a semiconductor manufacturing company to the semiconductor testing company. Based on RFID readers, tags and RFID middleware, label information where located on each cassette will be passed to the backend information system. Through RFID technology characteristic, this system immediately presents the RFID label information for the user to achieve tracing purpose. The research result unified the RFID and the semiconductor testing system to establish a set of immediate information management system. Through the RFID technology and flows integration, this system reduced the standard warehouse working-hour and increased more efficiency in production line. The enterprise saved the more manpower cost, and information transmission was more transparent between customers and suppliers.


Keywords: radio frequency identification; RFID; cassette management; semiconductor test industry; process control; supply chain management; SCM; inventory management; management information systems; location control; warehousing; handcar localisation; semiconductor testing.


DOI: 10.1504/IJITM.2013.051633


Int. J. of Information Technology and Management, 2013 Vol.12, No.1/2, pp.85 - 105


Available online: 25 Jan 2013



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