Int. J. of Nanomanufacturing   »   2012 Vol.8, No.5/6

 

 

Title: Micro and nano coordinate measuring technology with optical and tactile optical probes in high precision coordinate measuring machines

 

Authors: R. Christoph; I. Schmidt

 

Addresses:
Werth Messtechnik GmbH, Siemensstrasse 19, 35394 Giessen, Germany
Werth Messtechnik GmbH, Siemensstrasse 19, 35394 Giessen, Germany

 

Abstract: In addition to high precision coordinate measuring machines, micro and nano coordinate measuring technology requires probes with the highest precision and the ability to measure the smallest structures. Based on the proven ultra accurate coordinate measuring machine, the VideoCheck UA, we have upgraded several of the precision relevant components. To enable precise measurements of microstructures, optical probes and tactile or tactile-optical micro probes are required. These provide 3D probing capability and high structural resolution due to high optical resolution and respectively tiny probing elements. Typical measurement tasks and results will be shown using available optical sensors implemented in precise coordinate measuring machines. Special remarks will be given to a unique, full 3D tactile-optical probing system that overcomes the limitations of all known tactile probing systems. The new assembly and the target parameters will be presented as well as the current state of development.

 

Keywords: coordinate measurement; micro features; optical probes; fibre probes; focus variation; image processing; micro coordinate measuring; nano coordinate measuring; high precision CMMs; coordinate measuring machines; microstructure; nanomanufacturing; nanotechnology.

 

DOI: 10.1504/IJNM.2012.051104

 

Int. J. of Nanomanufacturing, 2012 Vol.8, No.5/6, pp.441 - 449

 

Submission date: 08 Dec 2011
Date of acceptance: 07 Mar 2012
Available online: 20 Dec 2012

 

 

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