Int. J. of Industrial and Systems Engineering   »   2012 Vol.12, No.3

 

 

Title: Chi-squared control chart for multiple attributes

 

Authors: Salah Haridy; Zhang Wu; John Flaig

 

Addresses:
School of Mechanical and Aerospace Engineering, Nanyang Technological University, 639798, Singapore
School of Mechanical and Aerospace Engineering, Nanyang Technological University, 639798, Singapore
Applied Technology, San Jose, CA 95125, USA

 

Abstract: In recent years, attribute control charts have been increasingly adopted in manufacturing processes and service sectors for monitoring the quality characteristics that cannot be numerically measured. The multiattribute control charts have been proved to be more effective than the simultaneous multiple individual charts for monitoring multiattribute processes. In this paper, a new multiattribute chi-squared (Χ²) chart is proposed to monitor the processes in which more than one type of defects exist on the non-conforming item. Some practical examples are given to illustrate the effectiveness of the new chart in monitoring the multiattribute processes compared with that of the individual p charts and other multiattribute charts.

 

Keywords: SPC; statistical process control; control charts; chi-squared charts; overall p charts; multiattribute charts; process monitoring.

 

DOI: 10.1504/IJISE.2012.049414

 

Int. J. of Industrial and Systems Engineering, 2012 Vol.12, No.3, pp.316 - 330

 

Available online: 03 Oct 2012

 

 

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