Int. J. of Technology Intelligence and Planning   »   2012 Vol.8, No.1

 

 

Title: Capturing past experience: the Expert Scan visual mapping process

 

Authors: Simon J. Ford; Michèle J. Routley; Robert Phaal; David R. Probert

 

Addresses:
Centre for Technology Management, Institute for Manufacturing, University of Cambridge, 17 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.
Centre for Technology Management, Institute for Manufacturing, University of Cambridge, 17 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.
Centre for Technology Management, Institute for Manufacturing, University of Cambridge, 17 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.
Centre for Technology Management, Institute for Manufacturing, University of Cambridge, 17 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom

 

Abstract: This paper describes and reflects on the development and application of the Expert Scan, a semi-structured visual mapping process, which can be used to record historical interview-based accounts of industrial, organisational and technological change. The process has been applied and refined through 13 interviews with experienced professionals in commercial inkjet in the UK. It has been found to offer significant advantages over the non-visual interview, including improving interviewee engagement and providing opportunities for real-time evaluation. Post-interview, data obtained from the Expert Scan can be synthesised with other scans or used as an input to future-oriented roadmapping activities.

 

Keywords: visual mapping; mapping process; experience capture; past experience; experts; qualitative interview; historical account; retrospective reports; TRM; technology roadmapping; technology intelligence; organisational change; technological change; industrial change; commercial inkjet.

 

DOI: 10.1504/IJTIP.2012.047377

 

Int. J. of Technology Intelligence and Planning, 2012 Vol.8, No.1, pp.47 - 59

 

Available online: 17 Jun 2012

 

 

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