Title: Design and characteristic evaluation of a high-speed CMOS imaging system

Authors: Yuanyuan Shang, Yong Guan, Xumin Liu, Weigong Zhang

Addresses: College of Information Engineering, Capital Normal University, Haidian Dist., Beijing 100048, China; Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Haidian Dist., Beijing 100048, China. ' College of Information Engineering, Capital Normal University, Haidian Dist., Beijing 100048, China; Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Haidian Dist., Beijing 100048, China. ' College of Information Engineering, Capital Normal University, Haidian Dist., Beijing 100048, China; Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Haidian Dist., Beijing 100048, China. ' College of Information Engineering, Capital Normal University, Haidian Dist., Beijing 100048, China; Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Haidian Dist., Beijing 100048, China

Abstract: This paper introduces the design of a high-speed 2K × 2K Complementary Metal-Oxide-Semi-Conductor (CMOS) camera, which is part of the Wide Field Monitor System proposed in China recently. It consists of an analogue and a digital embedded system integrated with a NIOS II soft-core processor serving as the control and data acquisition system. Research on characteristic measurement for CMOS imagers, including readout noise, linearity, Quantum Efficiency (QE), photo response non-uniformity, dark current, full-well capacity and gain, was also carried out. The evaluation results indicate that this high-speed CMOS camera can meet the requirements of the Wide Field Monitor System.

Keywords: CMOS image sensors; readout noise; gain; quantum efficiency; full-well capacity; photo response non-uniformity; CMOS imaging systems; wide field monitor systems; complementary CMOS camera; embedded systems; high-speed CMOS cameras.

DOI: 10.1504/IJSISE.2010.036886

International Journal of Signal and Imaging Systems Engineering, 2010 Vol.3 No.3, pp.148 - 154

Received: 01 Sep 2009
Accepted: 11 May 2010
Published online: 15 Nov 2010 *

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