Int. J. of Adaptive and Innovative Systems   »   2010 Vol.1, No.3/4

 

 

Title: Embedded diagnosis based on vibration data

 

Author: Ouadie Bennouna, Houcine Chafouk, Olivier Robin, Jean-Philippe Roux

 

Addresses:
IRSEEM/ESIGELEC – Technopole du Madrillet, Avenue Galilee, BP 10024 – 76801 Saint Etienne du Rouvray, France.
IRSEEM/ESIGELEC – Technopole du Madrillet, Avenue Galilee, BP 10024 – 76801 Saint Etienne du Rouvray, France.
CEVAA – 2 rue Joseph Fourier, 76800 Saint Etienne du Rouvray, France.
CEVAA – 2 rue Joseph Fourier, 76800 Saint Etienne du Rouvray, France

 

Abstract: This article deals with a method based on vibration data measured on electronic systems to detect, identify and localise defects generated in these systems, in order to improve their reliability. The diagnosis procedure is based on the combination of wavelet transforms and neural networks; this procedure is applied to a simplified printed circuit board.

 

Keywords: fault diagnosis; vibration; reliability analysis; wavelet transforms; neural networks; embedded systems; electronic systems; PCB reliability.

 

DOI: 10.1504/IJAIS.2010.034805

 

Int. J. of Adaptive and Innovative Systems, 2010 Vol.1, No.3/4, pp.285 - 296

 

Available online: 23 Aug 2010

 

 

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