Int. J. of Technology Management   »   1988 Vol.3, No.1/2

 

 

Title: Commercial development of an on-line grain-size monitor

 

Author: R.D. Johnston, R.D. Diamand

 

Addresses:
BNF Metals Technology Centre, Wantage, Oxfordshire, UK.
BNF Metals Technology Centre, Wantage, Oxfordshire, UK

 

Abstract: This paper traces the development of the BNF grain-size monitor from the earliest concept to a saleable commercial instrument. The project provides an excellent example of close collaboration between a research and development organization – BNF Metals Technology Centre – and a commercial instrument maker – Oxford Analytical Instruments Ltd. The paper explains the importance of grain size in annealed copper alloy strip and highlights the drawbacks associated with the traditional methods of grain-size measurement. The new unit, which recently became commercially available to industry, enables grain size to be determined non-destructively and instantaneously on-line, making possible swift adjustment to process controls.

 

Keywords: quality control; research collaboration; on-line measurement; grain-size measurement; BNF Metals Technology Centre; Oxford Analytical Instruments Ltd; grain-size monitors; annealed copper alloy strip; R&D; research and development.

 

DOI: 10.1504/IJTM.1988.025953

 

Int. J. of Technology Management, 1988 Vol.3, No.1/2, pp.21 - 29

 

Available online: 26 May 2009

 

 

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