Title: Modelling Microstructures with OOF2

 

Author: Andrew C.E. Reid, Rhonald C. Lua, R. Edwin Garcia, Valerie R. Coffman, Stephen A. Langer

 

Address: Information Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8910, Gaithersburg, MD, 20899-8910, USA. ' Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8555, Gaithersburg, MD, 20899-8555, USA. ' School of Materials Engineering, Purdue University, West Lafayette, IN, 47907-2044, USA. ' Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8555, Gaithersburg, MD, 20899-8555, USA. ' Information Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8910, Gaithersburg, MD, 20899-8910, USA

 

Journal: Int. J. of Materials and Product Technology, 2009 Vol.35, No.3/4, pp.361 - 373

 

Abstract: OOF2 is a program designed to compute the properties and local behaviour of material microstructures, starting from a two-dimensional representation, an image, of arbitrary geometrical complexity. OOF2 uses the finite element method to resolve the local behaviour of a material, and is designed to be used by materials scientists with little or no computational background. It can solve for a wide range of physical phenomena and can be easily extended. This paper is an introduction to some of its most basic and important features.

 

Keywords: finite element method; FEM; material microstructure.

 

DOI: 10.1504/IJMPT.2009.025687

10.1504/09.25687

 

 

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