Title: Modelling and simulation for the prediction of surface roughness in plane magnetic abrasive finishing

Authors: Er Atul Khatri, Vinod Yadava

Addresses: Department of Mechanical Engineering, Motilal Nehru National Institute of Technology, Allahabad, Uttar Pradesh 211004, India. ' Department of Mechanical Engineering, Motilal Nehru National Institute of Technology, Allahabad, Uttar Pradesh 211004, India

Abstract: The final machining (or finishing) of precision parts with high level of surface finish and close tolerance is making the application of Magnetic Abrasive Finishing (MAF) technology increasingly important. MAF is a magnetic field controlled advanced finishing process used for fine finishing of metals and non-metals. In MAF, the workpiece is kept between the two poles of electromagnet and the working gap is filled with Magnetic Abrasive Particles (MAPs). MAPs form a Magnetic Abrasive Flexible Brush (MAFB) due to the effect of magnetic field in working gap. This paper focuses on the modelling and simulation of MAF process for the theoretical prediction of surface roughness on the workpiece surface. A finite element-based model is developed to find the magnetic scalar potential distribution in the working gap. A theoretical model is also developed for the prediction of surface roughness on the workpiece surface due to the indentation and microcutting by MAPs under magnetic machining pressure. The simulation results are compared with the experimental results available in the literature and they are found to agree well. The effects of different process parameters are also studied.

Keywords: magnetic abrasive finishing; MAF; magnetic abrasive flexible brush; MAFB; magnetic abrasive particles; MAP; material removal; surface roughness; FEM; finite element method; modelling; simulation.

DOI: 10.1504/IJISE.2008.016744

International Journal of Industrial and Systems Engineering, 2008 Vol.3 No.2, pp.189 - 210

Published online: 21 Jan 2008 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article