Low-power test sets under test-related primary input constraints
by Irith Pomeranz
International Journal of Critical Computer-Based Systems (IJCCBS), Vol. 4, No. 3, 2013

Abstract: This paper considers the generation of low-power test sets under test-related primary input constraints. Such constraints are used for addressing tester limitations related to the application of tests at-speed. Specifically, the paper considers the switching activity (which measures the power dissipation) during the fast functional clock cycles of broadside tests with constrained primary input vectors. For a functional broadside test, the switching activity during the fast functional clock cycle is guaranteed not to exceed the switching activity possible during functional operation. Therefore, functional broadside tests are appropriate as low-power tests. In addition, the switching activity of functional broadside tests can be used for bounding the switching activity of other tests in a low-power test set. The paper observes that functional broadside tests for computing the bound should be generated under the same primary input constraint as the low-power test set. This is important since primary input constraints affect the switching activity possible in parts of the circuit that are influenced by the primary inputs. It helps ensure that the switching activity in other parts of the circuit will not be higher, or not be restricted to be lower, than during functional operation.

Online publication date: Tue, 29-Apr-2014

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Critical Computer-Based Systems (IJCCBS):
Login with your Inderscience username and password:

Username:        Password:          Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com