A demerit system for binomial distributed defects applied to medication error severity data
by Qin Hong, Justin R. Chimka
International Journal of Quality Engineering and Technology (IJQET), Vol. 1, No. 4, 2010

Abstract: In this article we introduce a demerit system for generally m defect classes based on the assumption that total demerits has the binomial distribution. Then we derive general expressions for error probabilities Type I and Type II that would make possible economic design. We assume the binomial distribution assumption is reasonable for medication error severity data, and our new demerit system seems to provide an appropriate monitor.

Online publication date: Thu, 30-Sep-2010

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